WENTWORTH MP0-901, INSPECTION EQUIPMENT, 150MM WAFER CAPACITY

THE WENTWORTH MP0-901 (MP0901) IS A MANUAL ANALYTICAL WAFER PROBER, CATEGORIZED AS INSPECTION EQUIPMENT. IT IS ENGINEERED FOR PRECISE CHARACTERIZATION AND ELECTRICAL TESTING OF SEMICONDUCTOR DEVICES DIRECTLY ON THE WAFER. THIS SYSTEM IS DESIGNED TO HANDLE WAFERS UP TO 6 INCHES (150MM) IN DIAMETER. KEY FEATURES INCLUDE A HIGH-RESOLUTION XY STAGE, PROVIDING ACCURATE AND REPEATABLE POSITIONING OF THE WAFER, AND AN INTEGRATED MICROSCOPE BRIDGE FOR OPTICAL INSPECTION AND PRECISE PROBE TIP PLACEMENT. THE PROBER INCORPORATES A STABLE PLATEN STRUCTURE TO FACILITATE THE MOUNTING OF VARIOUS PROBE CARDS AND MANIPULATORS, SUPPORTING A RANGE OF ANALYTICAL AND DIAGNOSTIC APPLICATIONS.